中国国家标准分类目录 - L 电子元器件与信息技术(一)
1 GB/T 249-1989 半导体分立器件型号命名方法 The rule of type designation for discrete semiconductor devices
2 GB/T 4024-1983 半导体器件反向阻断三极晶闸管的测试方法 Measuring methods for semiconductor device--Reverse blocking triode thyristor
3 GB/T 4586-1994 半导体器件 分立器件 第8部分: 场效应晶体管 Semiconductor devices--Discrete devices--Part 8: Field-effect transistors
4 GB/T 4587-1994 半导体分立器件和集成电路 第7部分: 双极型晶体管 Semiconductor discrete devices and integrated circuits--Part 7: Bipolar transistors
5 GB/T 4589.1-1989 半导体器件 分立器件和集成电路总规范 (可供认证用) Semiconductor devices—Generic specification for discrete devices and integrated circuits
6 GB/T 4619-1996 液晶显示器件测试方法 Measuring methods for liquid crystal display devices
7 GB/T 4654-1984 碳化硅、锆英砂、陶瓷类红外辐射加热器通用技术条件 The general technical specifications on silicon carbide and zircon ceramic infrared heater
8 GB/T 4799-1984 气体激光器型号命名方法 The denominating method of type for gas lasers
9 GB/T 4931-1985 氦氖激光器系列型谱 The series and type spectrum for helium neon lasers
10 GB/T 4932-1985 二氧化碳激光器系列型谱 The series and type spectrum for carbon dioxide lasers
11 GB/T 4937-1995 半导体器件机械和气候试验方法 Mechanical and climatic test methods for semiconductor devices
12 GB/T 4938-1985 半导体分立器件接收和可靠性 Acceptance and reliability for discrete semiconductor devices
13 GB/T 4939-1985 普通整流管 Rectifier diodes for general purpose
14 GB/T 4940-1985 普通晶闸管 Triode thyristors for general purpose
15 GB/T 6218-1996 开关用双极型晶体管空白详细规范 Blank detail specification for bipolar transistors for switching applications
16 GB/T 6256-1986 工业加热三极管空白详细规范 (可供认证用) Blank detail specification for industrial heating triodes
17 GB/T 6570-1986 微波二极管测试方法 Measuring methods for microwave diodes
18 GB/T 6571-1995 半导体器件 分立器件 第3部分:信号(包括开关)和调整二极管 Semiconductor devices--Discrete devices--Part 3: Signal(including switching)and regulator diodes
19 GB/T 6588-1986 通用信号和(或)开关半导体二极管空白详细规范 (可供认证用) Blank detail specification for general purpose signal and/or switching semiconductor diodes
20 GB/T 6589-1986 电压调整和电压基准二极管 (包括温度补尝精密基准二极管) 空白详细规范 (可供认证用) Blank detail specification for volt age regulator diodes and voltage reference diodes, excluding temperature compensated precision reference diodes
21 GB/T 7577-1996 低频放大管壳额定的双极型晶体管空白详细规范 Blank detail specification for case-rated bipolar transistors for low-frequency amplification
22 GB/T 7581-1987 半导体分立器件外形尺寸 Dimensions of outlines for semiconductor discrete devices
23 GB/T 9436-1988 液晶显示器件参数符号 Letter symbols of parameter for liquid crystal display devices
24 GB/T 11153-1989 激光小功率计性能检测方法 Parameters testing method of laser power meter in low range
25 GB/T 12300-1990 功率晶体管安全工作区测试方法 Test methods of safe operating area for power transistors
26 GB/T 12560-1990 半导体器件 分立器件分规范 (可供认证用) Semiconductor devices—Sectional specification for discrete devices
27 GB/T 12561-1990 发光二极管空白详细规范 (可供认证用) Blank detail specification for light emitting diodes
28 GB/T 12562-1990 PIN 二极管空白详细规范 (可供认证用) Blank detail specification for PIN diodes
29 GB/T 12848-1991 扭曲向列型液晶显示器件总规范 (可供认证用) Generic specification of twisted nematic liquid crystal display devices
30 GB/T 12849-1991 钟、表用扭曲向列型液晶显示器件空白详细规范 (可供认证用) Blank detail specification of twisted nematic liquid crystal displays for watches
31 GB/T 12850-1991 计算器用扭曲向列型液晶显示器件空白详细规范 (可供认证用) Blank detail specification of twisted nematic liquid crystal displays for calculators
32 GB/T 12851-1991 仪器、仪表用扭曲向列型液晶显示器件空白详细规范 (可供认证用) Blank detail specification of twisted nematic liquid crystal displays for instruments
33 GB/T 13063-1991 电流调整和电流基准二极管空白详细规范 Blank detail specification for current-regulator and current-reference diodes
34 GB/T 13066-1991 单结晶体管空白详细规范 Blank detail specification for unijunction transistors
35 GB/T 14078-1993 氦氖激光器技术条件 He-Ne laser specification
36 GB/T 14116-1993 彩色液晶显示器件的光度和色度的测试方法 Photomentric and colorimetric methods of measurement of color liquid crystal displays
37 GB/T 14117-1993 彩色液晶显示器件空白详细规范 (可供认证用) Blank detail specification of color liquid crystal displays
38 GB/T 14863-1993 用栅控和非栅控二极管的电压-电容关系测定硅外延层中净载流子浓度的标准方法 Standard test method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes
39 GB/T 15137-1994 体效应二极管空白详细规范 Blank detail specification for gunn diodes
40 GB/T 15167-1994 半导体激光光源总规范 General specification for light source of semiconductor lasers
41 GB/T 15177-1994 微波检波、混频二极管 空白详细规范 Blank detail specification for microwave detectors and mixer diodes
42 GB/T 15178-1994 变容二极管空白详细规范 Blank detail specification for variable capacitance diodes
43 GB/T 15449-1995 管壳额定开关用场效应晶体管 空白详细规范 Blank detail-specification for field-effect transistors for case-rated swatching application
44 GB/T 15450-1995 硅双栅场效应晶体管 空白详细规范 Blank detail specification for silicon dual-gate field-effect transistors
45 GB/T 15529-1995 半导体发光数码管空白详细规范 Blank detail specification for LED numeric displays
46 GB/T 15649-1995 半导体激光二极管空白详细规范 Blank detail specification for semiconductor laser diodes
47 GB/T 15651-1995 半导体器件 分立器件和集成电路 第5部分:光电子器件 Semiconductor devices--Discrete devices and integrated circuits--Part 5: Optoelectronic devices
48 GB/T 15655-1995 超扭曲向列型液晶显示器件分规范 Sectional specification for super-twisted nematic liquid crystal display devices
49 GB/T 15656-1995 超扭曲向列型液晶显示器件 空白详细规范 Blank detail specification of super-twisted nematic liquid crystal display devices
50 GB/T 16468-1996 静电感应晶体管系列型谱 Series programmes for static induction transistors
51 GB/T 4023-1997 半导体器件分立器件和集成电路 第2部分: 整流二极管 Semiconductor devices--Discrete devices and integrated circuits--Part 2: Rectifier diodes
52 GB/T 6351-1998 半导体器件 分立器件 第2部分: 整流二极管 第一篇 100A以下环境或管壳额定整流二极管(包括雪崩整流二极管)空白详细规范 Semiconductor devices Discrete devices Part 2: Rectifier diodes Section One-Blank detail specification for rectifier diodes(including avalanche recti-fier diodes)1, ambient and case-rated,up to 100A
53 GB/T 6352-1998 半导体器件 分立器件 第6部分: 闸流晶体管 第一篇 100A以下环境或管壳额定反向阻断三极闸流晶体管空白详细规范 Semiconductor devices Discrete devices Part 6: Thyristors Section One-Blank detail specification for reverse blocking triode thyristors,ambient or case-rated,up to 100A
54 GB/T 6590-1998 半导体器件 分立器件 第6部分: 闸流晶体管 第二篇 100A以下环境或管壳额定的双向三极闸流晶体管空白详细规范 Semiconductor devices Discrete devices Part 6: Thyristors Section Two-Blank detail specification for bidirectional triode thyristors(triacs),ambient or case-rated,up to 100A
55 GB/T 6217-1998 半导体器件 分立器件 第7部分: 双极型晶体管 第一篇 高低频放大环境额定的双极型晶体管空白详细规范 Semiconductor Devices Discrete devices Part 7: Bipolar transistors Section One-Blank detail specification for ambient-rated bipolar transistors for low and high frequency amplification
56 GB/T 7576-1998 半导体器件 分立器件 第7部分: 双极型晶体管 第四篇 高频放大管壳额定双极型晶体管空白详细规范 Semiconductor devices Discrete devices Part 7: Bipolar transistors Section Four-Blank detail specification for case-rated bipolar transistors for high-frequency amplification
57 GB/T 6219-1998 半导体器件 分立器件 第8部分: 场效应晶体管 第一篇 1GHz、5W以下的单栅场效应晶体管 空白详细规范 Semiconductor devices Discrete devices Part 8: Field-effect transistors Section One-Blank detail specification for singe-gate field-effect transistors up to 5W and 1GHz
58 GB/T 17573-1998 半导体器件 分立器件和集成电路 第1部分: 总则 Semiconductor devices Discrete devices and integrated circuits Part 1: General
50/54 光电子器件
1 GB 10320-1995 激光设备和设施的电气安全 Electrical safety of laser equipment and installations
2 GB/T 12507-1990 光纤光缆连接器 第一部分: 总规范 Connectors for optical fibres and cables—Part 1: Generic specification
3 GB/T 12511-1990 纤维光学开关 第一部分: 总规范(可供认证用) Fibre optic switches—Part 1: Generic specification
4 GB/T 12512-1990 纤维光学衰减器 第一部分: 总规范(可供认证用) Fibre optic attenuators—Part 1: Generic specification
5 GB/T 12565-1990 半导体器件 光电子器件分规范 (可供认证用) Semiconductor devices—Sectional specification for optoelectronic devices
6 GB/T 13583-1992 红外探测器外形尺寸系列 Outline dimension series of infrared detectors
7 GB/T 13584-1992 红外探测器参数测试方法 Measuring methods for parameters of infrared detectors
8 GB/T 13712-1992 纤维光学调制器 第一部分∶总规范 (可供认证用) Fibre optic modulators—Part 1:Generic specification
9 GB/T 13713-1992 纤维光学分路器 第一部分∶总规范 (可供认证用) Fibre optic branching devices—Part 1:Generic specification
10 GB/T 13714-1992 纤维光学分路器 第三部分∶分规范 １至ｎ个波长复用器／解复用器 (可供认证用) Fiber optic branching devices—Part 3:Sectional specification—One-to-n wavelength multiplexer/demultiplexer
11 GB/T 13739-1992 激光辐射横模鉴别方法 Testing method of transverse mode of laser radiation
12 GB/T 13740-1992 激光辐射发散角测试方法 Testing method of divergence angle of laser radiation
13 GB/T 13741-1992 激光辐射光束直径测试方法 Testing method of beam diameter of laser radiation
14 GB/T 13863-1992 激光辐射功率测试方法 Testing method for laser radiant power
15 GB/T 13864-1992 激光辐射功率稳定度测试方法 Testing method for laser radiant power stability
16 GB/T 14136.1-1993 纤维光学滤光器 第一部分: 总规范(可供认证用) Fiber optic filters--Part 1: Generic specification
17 GB/T 14137-1993 光纤机械式固定接头插入损耗测试方法 Optical fiber mechanical--type splice insertion loss test
18 GB/T 14275-1993 纤维光学调制器 第二部分: 分规范 波导电光调制器 (可供认证用) Fiber optic modulators--Part 2: Sectional specification--Waveguide electrooptic modulators
19 GB/T 15175-1994 固体激光器主要参数测试方法 Measurement methods for main parameter of solid-state lasers
20 GB/T 15490-1995 固体激光器总规范 General specification for solid state lasers
21 GB/T 16529-1996 光纤光缆接头 第1部分: 总规范 构件和配件 Splices for optical fibres and cables--Part 1: Generic specification--Hardware and accessories
22 GB/T 16530-1996 单模纤维光学器件回波损耗偏振依赖性测量方法 Measuring method for polarization dependence of return loss of a single-mode fibre optic component
23 GB/T 13265-1997 纤维光学隔离器 第1部分: 总规范 Fiber optic isolators--Part 1: Generic specification
24 GB/T 13265.1-1997 纤维光学隔离器 第1-1部分: 空白详细规范 Fibre optic isolators--Part 1-1: Blank detail specification
25 GB/T 12507.2-1997 光纤光缆连接器 第2部分: F-SMA型光纤光缆连接器分规范 Connectors for optical fibres and cables-Part 2: Sectional specification for fibre optic connector--Type F-SMA
26 GB/T 16529.3-1997 光纤光缆接头 第3部分: 分规范 光纤光缆熔接式接头 Splices for optical fibres and cables--Part 2: Sectional specification-Splice organizers and closures for optical fibres and cables
27 GB/T 16529.4-1997 光纤光缆接头 第4部分: 分规范 光纤光缆机械式接头 Splices for optical fibres and cables--Part 4: Sectional specification Mechanical splices for optical fibres and cables
28 GB/T 16529.2-1997 光纤光缆接头 第2部分: 分规范 光纤光缆接头盒和集纤盘 Splices for optical fibres and cables--Part 2: Sectional specification-Splice organizers and closures for optical fibres and cables
29 GB/T 17444-1998 红外焦平面阵列特性参数测试技术规范 The technical norms for measurement and test of characteristic parameters of infrared focal plane arrays
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